s-3400 n variable-pressure scanning electron microscope (Hitachi Ltd)
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Hitachi Ltd
s-3400 n variable-pressure scanning electron microscope
S 3400 N Variable Pressure Scanning Electron Microscope, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/3400-n+variable+pressure+scanning+electron+microscope/10__1016_slash_j__jcrysgro__2021__126339-59-14-13
Average 90 stars, based on 1 article reviews
S 3400 N Variable Pressure Scanning Electron Microscope, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/3400-n+variable+pressure+scanning+electron+microscope/10__1016_slash_j__jcrysgro__2021__126339-59-14-13
Average 90 stars, based on 1 article reviews
s-3400 n variable-pressure scanning electron microscope - by Bioz Stars,
2026-10
90/100 stars
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Transmission Electron Microscopy:Article Title: Synthesis, properties and degradation of polyisobutylene-polyester graft copolymers Article Snippet: SEM micrographs were obtained using a Article Title: Biological Characterization of Microenvironments in a Hypersaline Cold Spring Mars Analog Article Snippet: Samples were lightly crushed using a sterile agate mortar and pestle and fragments transferred to carbon tape affixed to titanium TEM stub mounts and imaged at 40 Pa on a Microscopy:Article Title: Synthesis, properties and degradation of polyisobutylene-polyester graft copolymers Article Snippet: SEM micrographs were obtained using a Article Title: Biological Characterization of Microenvironments in a Hypersaline Cold Spring Mars Analog Article Snippet: Samples were lightly crushed using a sterile agate mortar and pestle and fragments transferred to carbon tape affixed to titanium TEM stub mounts and imaged at 40 Pa on a |